Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets

• Main Authors: Ning, Shoucong, Xu, Wenhui, Ma, Yinhang, Loh, Leyi, Pennycook, Timothy J, Zhou, Wu, Zhang, Fucai, Bosman, Michel, Pennycook, Stephen J, He, Qian, Loh, N Duane
• Other Authors: COLLEGE OF DESIGN AND ENGINEERING
• Format: Article
• Language: English
• Published: CAMBRIDGE UNIV PRESS 2022
• Subjects: Science & Technology; Technology; Materials Science, Multidisciplinary; Microscopy; Materials Science; 4D-STEM; atomic resolution; calibration; ptychography; PHASE-CONTRAST; 2D MATERIALS; STEM; PTYCHOGRAPHY; OPTIMIZATION
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/224596
• Institution: National University of Singapore

10.1017/S1431927622000320