DATA-DRIVEN FAILURE PREDICTION FOR MANUFACTURING PROCESSES

DATA-DRIVEN FAILURE PREDICTION FOR MANUFACTURING PROCESSES

Ph.D

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Bibliographic Details
Main Author: NAVEEN JOHN PUNNOOSE
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2022
Subjects:
Imbalanced Data, Failure Prediction, Quality Estimation, Convolutional Neural Networks, Fuzzy Logic, Semiconductor Industry
Online Access:https://scholarbank.nus.edu.sg/handle/10635/227565
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Institution: National University of Singapore
Language: English

Internet

https://scholarbank.nus.edu.sg/handle/10635/227565

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