Temporal intensity interferometry for characterization of very narrow spectral lines

10.1093/mnras/stx968

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Bibliographic Details
Main Authors: Tan, PK, Kurtsiefer, C
Other Authors: CENTRE FOR QUANTUM TECHNOLOGIES
Format: Article
Language:English
Published: OXFORD UNIV PRESS 2023
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/243247
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Institution: National University of Singapore
Language: English