Scanning electron microscope

US7294834

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Bibliographic Details
Main Author: KHURSHEED, ANJAM
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/32749
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Institution: National University of Singapore
id sg-nus-scholar.10635-32749
record_format dspace
spelling sg-nus-scholar.10635-327492024-11-09T02:43:29Z Scanning electron microscope KHURSHEED, ANJAM ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US7294834 Granted Patent 2012-05-02T02:29:50Z 2012-05-02T02:29:50Z 2007-11-13 Patent KHURSHEED, ANJAM (2007-11-13). Scanning electron microscope. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32749 NOT_IN_WOS PatSnap
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description US7294834
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
KHURSHEED, ANJAM
format Patent
author KHURSHEED, ANJAM
spellingShingle KHURSHEED, ANJAM
Scanning electron microscope
author_sort KHURSHEED, ANJAM
title Scanning electron microscope
title_short Scanning electron microscope
title_full Scanning electron microscope
title_fullStr Scanning electron microscope
title_full_unstemmed Scanning electron microscope
title_sort scanning electron microscope
publishDate 2012
url http://scholarbank.nus.edu.sg/handle/10635/32749
_version_ 1821232964228349952