Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements
Nuclear Inst. and Methods in Physics Research, B
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Main Authors: | Liew, S.C., Loh, K.K., Tang, S.M. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2012
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/34008 |
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Institution: | National University of Singapore |
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