Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements

Nuclear Inst. and Methods in Physics Research, B

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Bibliographic Details
Main Authors: Liew, S.C., Loh, K.K., Tang, S.M.
Other Authors: PHYSICS
Format: Article
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/34008
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Institution: National University of Singapore

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