Reliability and Aging Mechanisms of all-solid-state thin film lithium ion microbatteries

Reliability and Aging Mechanisms of all-solid-state thin film lithium ion microbatteries

Ph.D

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Bibliographic Details
Main Author: ZHU JING
Other Authors: MECHANICAL ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2012
Subjects:
lithium ion batteries, all-solid-state thin film microbatteries, interfacial reliability, aging mechanisms, nanoindentation, scanning probe microscopy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/35851
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Institution: National University of Singapore
Language: English

Internet

http://scholarbank.nus.edu.sg/handle/10635/35851

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