Micromotion in Trapped Atom-ion Systems

Ph.D

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Bibliographic Details
Main Author:	LE HUY NGUYEN
Other Authors:	NUS GRAD SCH FOR INTEGRATIVE SCI & ENGG
Format:	Theses and Dissertations
Language:	English
Published:	2012
Subjects:	Micromotion, atom ion interaction, trap, quantum gate, Paul trap, Floquet
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/35857
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-35857
record_format	dspace
spelling	sg-nus-scholar.10635-358572015-01-09T06:07:04Z Micromotion in Trapped Atom-ion Systems LE HUY NGUYEN NUS GRAD SCH FOR INTEGRATIVE SCI & ENGG ENGLERT, BERTHOLD-GEORG Micromotion, atom ion interaction, trap, quantum gate, Paul trap, Floquet Ph.D DOCTOR OF PHILOSOPHY 2012-12-31T18:02:58Z 2012-12-31T18:02:58Z 2012-08-06 Thesis LE HUY NGUYEN (2012-08-06). Micromotion in Trapped Atom-ion Systems. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/35857 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	Micromotion, atom ion interaction, trap, quantum gate, Paul trap, Floquet
spellingShingle	Micromotion, atom ion interaction, trap, quantum gate, Paul trap, Floquet LE HUY NGUYEN Micromotion in Trapped Atom-ion Systems
description	Ph.D
author2	NUS GRAD SCH FOR INTEGRATIVE SCI & ENGG
author_facet	NUS GRAD SCH FOR INTEGRATIVE SCI & ENGG LE HUY NGUYEN
format	Theses and Dissertations
author	LE HUY NGUYEN
author_sort	LE HUY NGUYEN
title	Micromotion in Trapped Atom-ion Systems
title_short	Micromotion in Trapped Atom-ion Systems
title_full	Micromotion in Trapped Atom-ion Systems
title_fullStr	Micromotion in Trapped Atom-ion Systems
title_full_unstemmed	Micromotion in Trapped Atom-ion Systems
title_sort	micromotion in trapped atom-ion systems
publishDate	2012
url	http://scholarbank.nus.edu.sg/handle/10635/35857
_version_	1681081633198833664

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