The 2-interval pattern matching problems and its application to ncRNA scanning

10.1007/978-3-642-00727-9_10

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Bibliographic Details
Main Authors: Wong, T.K.F., YiuT, S.M., Lam, W., Sung, W.-K.
Other Authors: COMPUTER SCIENCE
Format: Conference or Workshop Item
Published: 2013
Online Access:http://scholarbank.nus.edu.sg/handle/10635/40084
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Institution: National University of Singapore