Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability
Operations Research
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sg-nus-scholar.10635-449192015-01-08T03:00:36Z Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability Ou, J. Wein, L.M. DECISION SCIENCES Operations Research 44 1 196-205 OPREA 2013-10-10T04:37:41Z 2013-10-10T04:37:41Z 1996 Article Ou, J.,Wein, L.M. (1996). Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability. Operations Research 44 (1) : 196-205. ScholarBank@NUS Repository. 0030364X http://scholarbank.nus.edu.sg/handle/10635/44919 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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| description |
Operations Research |
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DECISION SCIENCES |
| author_facet |
DECISION SCIENCES Ou, J. Wein, L.M. |
| format |
Article |
| author |
Ou, J. Wein, L.M. |
| spellingShingle |
Ou, J. Wein, L.M. Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| author_sort |
Ou, J. |
| title |
Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| title_short |
Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| title_full |
Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| title_fullStr |
Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| title_full_unstemmed |
Sequential screening in semiconductor manufacturing, II: Exploiting lot-to-lot variability |
| title_sort |
sequential screening in semiconductor manufacturing, ii: exploiting lot-to-lot variability |
| publishDate |
2013 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/44919 |
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1681082989203685376 |