A model for correlated failures in N-version programming
10.1080/07408170490507729
Saved in:
Main Authors: | Dai, Y.S., Xie, M., Poh, K.L., Ng, S.H. |
---|---|
Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/51846 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Modeling and analysis of correlated software failures of multiple types
by: Dai, Y.-S., et al.
Published: (2014) -
On program and file assignment for distributed systems
by: Liu, G.Q., et al.
Published: (2014) -
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM
by: Pey, K.L., et al.
Published: (2014) -
Reliability of grid service systems
by: Dai, Y.S., et al.
Published: (2014) -
Reliability analysis and optimal version-updating for open source software
by: Li, X., et al.
Published: (2014)