Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation

Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation

10.1063/1.1935429

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Bibliographic Details
Main Authors: Liu, Y., Chen, L., Tan, C.Y., Liu, H.J., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/52812
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Institution: National University of Singapore
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Summary:10.1063/1.1935429

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