Nondestructive microwave permittivity characterization of ferroelectric thin film using microstrip dual resonator

10.1063/1.1632999

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Bibliographic Details
Main Authors: Tan, C.Y., Chen, L., Chong, K.B., Ong, C.K.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/53060
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Institution: National University of Singapore
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