A "thru-short" method for noise de-embedding of mosfets

10.1002/mop.24330

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Bibliographic Details
Main Authors:	Nan, L., Xiong, Y.-Z., Mouthaan, K., Issaoun, A., Shi, J., Ooi, B.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	De-embedding MOSFET Noise parameters
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/53878
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Institution:	National University of Singapore

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