A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry

• Main Authors: Ma, S., Quan, C., Zhu, R., Chen, L., Li, B., Tay, C.J.
• Other Authors: MECHANICAL ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Digital fringe projection profilometry (DFPP); Fourier spectrum analysis (FSA); Gamma correction; Spatial-carrier fringe patterns
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/54126
• Institution: National University of Singapore

10.1016/j.optcom.2011.11.041