A multilayer correction scheme for spreading resistance measurements

Solid State Electronics

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Bibliographic Details
Main Authors: Choo, S.C., Leong, M.S., Hong, H.L., Li, L., Tan, L.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54450
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Institution: National University of Singapore