A physically segmented hidden markov model approach for continuous tool condition monitoring: Diagnostics and prognostics

• Main Authors: Geramifard, O., Xu, J.-X., Zhou, J.-H., Li, X.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Diagnostics; feature selection; hidden Markov model (HMM); prognostics; tool condition monitoring (TCM)
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/54707
• Institution: National University of Singapore

10.1109/TII.2012.2205583