Zhang, G., Yoo, W., Ling, C., & ENGINEERING, E. &. C. (2014). A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET.
Chicago Style CitationZhang, G., W.J Yoo, C.H Ling, and ELECTRICAL & COMPUTER ENGINEERING. A Time-dependent Technique for Carrier Recombination and Generation Lifetime Measurement in SOI MOSFET. 2014.
MLA引文Zhang, G., W.J Yoo, C.H Ling, and ELECTRICAL & COMPUTER ENGINEERING. A Time-dependent Technique for Carrier Recombination and Generation Lifetime Measurement in SOI MOSFET. 2014.
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