A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET

A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET

10.1016/j.sse.2008.07.007

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Bibliographic Details
Main Authors: Zhang, G., Yoo, W.J., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Carrier lifetimes
Metal-oxide-semiconductor field-effect transistor
Silicon-on-insulator
Time-dependent technique
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54834
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/54834

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