Characterization of gate charging N-channel mosfet to determine the effects of different gate bias voltages and temperature conditions

• Main Author: Garcia, Rommel Galang
• Format: text
• Language: English
• Published: Animo Repository 2008
• Subjects: Metal Oxide Semiconductor Field Effect Transistor; Metal oxide semiconductors; Field-effect transistors; Electrical and Computer Engineering
• Online Access: https://animorepository.dlsu.edu.ph/etd_masteral/3726; https://animorepository.dlsu.edu.ph/context/etd_masteral/article/10564/viewcontent/CDTG004470_P.pdf
• Institution: De La Salle University

Usual applications of Metal Oxide Semiconductor Field Effect Transistor (MOSFET) such as in the field of battery operated systems; drivers and solid state relays require a stable threshold voltage. A MOSFET with varying threshold voltage can cause degradation of the output signal or complete malfunc...