Interfacial polarization in Al-Y2O3-SiO2-Si capacitor

بواسطة Ling, C.H.
منشور في 2014

Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's

بواسطة Ling, C.H.
منشور في 2014

Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance

بواسطة Ling, C.H.
منشور في 2014

Observation of zero temperature coefficient of capacitance in the MOS capacitor

بواسطة Ling, C.H.
منشور في 2014

Some characteristics of the zero-temperature-coefficient capacitance of an MOS capacitor in accumulation

بواسطة Ling, C.H.
منشور في 2014

A diffusion model for carrier transport in a polycrystalline film

بواسطة Ling, C.H.
منشور في 2014

Observation of a high-resistance to a low-resistance transition in a silicon bicrystal

بواسطة Ling, C.H.
منشور في 2014

Trap generation at Si/SiO2 interface in submicrometer metal-oxide-semiconductor transistors by 4.9 eV ultraviolet irradiation

بواسطة Ling, C.H.
منشور في 2014

Charge trapping in interpoly ONO film

بواسطة Lira, K.S., Ling, C.H.
منشور في 2014

Teaching semiconductor device physics with two-dimensional numerical solver

بواسطة Yeow, Y.T., Ling, C.H.
منشور في 2014

A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET's

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

On the dominant interface trap generation process during hot-carrier stressing

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014

A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs

بواسطة Ang, D.S., Ling, C.H.
منشور في 2014