A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

10.1109/55.585365

Saved in:
Bibliographic Details
Main Authors: Ang, D.S., Ling, C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54496
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore