Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

Microelectronic Engineering

Saved in:
Bibliographic Details
Main Authors: Ang, D.S., Ling, C.H., Yeow, Y.T.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62824
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore