Teaching semiconductor device physics with two-dimensional numerical solver

بواسطة Yeow, Y.T., Ling, C.H.
منشور في 2014

A high return loss of microwave bandpass filter using superconducting electrospun YBCO nanostructures

بواسطة Jasim, S. E., Jusoh, M. A., Yeow, Y. K., Jose, R.
منشور في 2018

Electromagnetic shielding effectiveness of gypsum-magnetite composite at x-band frequency

بواسطة Jusoh, M. A., Yeow, Y. K., Nazlan, R., Esa, F.
منشور في 2019

Effect of blowing agent to the dielectric properties of polyurethane-empty fruit bunch composite in x-band frequency

بواسطة Mahmud, S. N. S., Jusoh, M. A., Yeow, Y. K., Esa, F.
منشور في 2020

Electromagnetic shielding effectiveness of gypsum-magnetite composite at x-band frequency

بواسطة Mohamad Ashry, Jusoh, Yeow, Y. K., Rodziah, Nazlan, Fahmiruddin, Esa
منشور في 2019

A High Return Loss of Microwave Bandpass Filter Using Superconducting Electrospun YBCO Nanostructures

بواسطة Jasim, S. E., M. A., Jusoh, Yeow, Y. K., Rajan, Jose
منشور في 2018

Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

بواسطة Ang, D.S., Ling, C.H., Yeow, Y.T.
منشور في 2014

Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

بواسطة Yeow, Y.T., Ling, C.H., Ah, L.K.
منشور في 2014

Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements

بواسطة Ling, C.H., Yeow, Y.T., Ah, L.K.
منشور في 2014

Modelling of the "Gated-diode" configuration in bulk MOSFET's

بواسطة Yip, A., Yeow, Y.T., Samudra, G.S., Ling, C.H.
منشور في 2014

Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dV

بواسطة Hong, Y.D., Yan, J., Wong, K.M., Yeow, Y.T., Chim, W.K.
منشور في 2014

Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement

بواسطة Hong, Y.D., Yeow, Y.T., Chim, W.K., Yan, J., Wong, K.M.
منشور في 2014

Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulation

بواسطة Chim, W.K., Wong, K.M., Teo, Y.L., Lei, Y., Yeow, Y.T.
منشور في 2014

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

بواسطة Hong, Y.D., Yeow, Y.T., Chim, W.-K., Wong, K.-M., Kopanski, J.J.
منشور في 2014

Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

بواسطة Ling, C.H., Yeow, Y.T., Ah, L.K., Yung, W.H., Choi, W.K.
منشور في 2014

Beam controller antenna for WiMAX application

بواسطة Leong, L. W., Hoon, W. F., Yeow, Y. K., Malek, M. A., Yew, L. C., Seng, L. Y., Rosli, S. J.
منشور في 2017

Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy Measurements

بواسطة Chim, W.K., Wong, K.M., Yeow, Y.T., Hong, Y.D., Lei, Y., Teo, L.W., Choi, W.K.
منشور في 2014