Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

Microelectronic Engineering

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Main Authors:	Ang, D.S., Ling, C.H., Yeow, Y.T.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62824
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-628242015-01-14T08:27:08Z Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals Ang, D.S. Ling, C.H. Yeow, Y.T. ELECTRICAL ENGINEERING Microelectronic Engineering 28 1-4 257-260 MIENE 2014-06-17T06:55:15Z 2014-06-17T06:55:15Z 1995-06 Article Ang, D.S.,Ling, C.H.,Yeow, Y.T. (1995-06). Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals. Microelectronic Engineering 28 (1-4) : 257-260. ScholarBank@NUS Repository. 01679317 http://scholarbank.nus.edu.sg/handle/10635/62824 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Microelectronic Engineering
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. Yeow, Y.T.
format	Article
author	Ang, D.S. Ling, C.H. Yeow, Y.T.
spellingShingle	Ang, D.S. Ling, C.H. Yeow, Y.T. Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
author_sort	Ang, D.S.
title	Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
title_short	Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
title_full	Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
title_fullStr	Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
title_full_unstemmed	Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals
title_sort	study of hot-carrier degradation in submicrometer ldd nmosfet's from 1 f noise and charge pumping current measurements at different temperature anneals
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62824
_version_	1681085846319529984

Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

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