A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement
10.1109/55.585365
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sg-nus-scholar.10635-544962024-11-14T22:47:19Z A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME 10.1109/55.585365 IEEE Electron Device Letters 18 6 299-301 EDLED 2014-06-16T09:31:44Z 2014-06-16T09:31:44Z 1997-06 Article Ang, D.S., Ling, C.H. (1997-06). A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement. IEEE Electron Device Letters 18 (6) : 299-301. ScholarBank@NUS Repository. https://doi.org/10.1109/55.585365 07413106 http://scholarbank.nus.edu.sg/handle/10635/54496 A1997XA74300020 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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NUS Library |
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| description |
10.1109/55.585365 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
| format |
Article |
| author |
Ang, D.S. Ling, C.H. |
| spellingShingle |
Ang, D.S. Ling, C.H. A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| author_sort |
Ang, D.S. |
| title |
A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| title_short |
A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| title_full |
A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| title_fullStr |
A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| title_full_unstemmed |
A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement |
| title_sort |
new assessment of the self-limiting hot-carrier degradation in ldd nmosfet's by charge pumping measurement |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/54496 |
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1821228879323332608 |