A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET

10.1016/j.sse.2008.07.007

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Main Authors: Zhang, G., Yoo, W.J., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/54834
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-548342023-10-26T09:29:00Z A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET Zhang, G. Yoo, W.J. Ling, C.H. ELECTRICAL & COMPUTER ENGINEERING Carrier lifetimes Metal-oxide-semiconductor field-effect transistor Silicon-on-insulator Time-dependent technique 10.1016/j.sse.2008.07.007 Solid-State Electronics 52 11 1773-1777 SSELA 2014-06-17T02:36:03Z 2014-06-17T02:36:03Z 2008-11 Article Zhang, G., Yoo, W.J., Ling, C.H. (2008-11). A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET. Solid-State Electronics 52 (11) : 1773-1777. ScholarBank@NUS Repository. https://doi.org/10.1016/j.sse.2008.07.007 00381101 http://scholarbank.nus.edu.sg/handle/10635/54834 000261358900014 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Carrier lifetimes
Metal-oxide-semiconductor field-effect transistor
Silicon-on-insulator
Time-dependent technique
spellingShingle Carrier lifetimes
Metal-oxide-semiconductor field-effect transistor
Silicon-on-insulator
Time-dependent technique
Zhang, G.
Yoo, W.J.
Ling, C.H.
A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
description 10.1016/j.sse.2008.07.007
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Zhang, G.
Yoo, W.J.
Ling, C.H.
format Article
author Zhang, G.
Yoo, W.J.
Ling, C.H.
author_sort Zhang, G.
title A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
title_short A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
title_full A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
title_fullStr A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
title_full_unstemmed A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET
title_sort time-dependent technique for carrier recombination and generation lifetime measurement in soi mosfet
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/54834
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