Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

10.1109/JPHOTOV.2013.2284375

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Bibliographic Details
Main Authors: Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
Format: Article
Published: 2016
Subjects:
Charge carrier lifetime
eddy currents
photoconductivity
silicon
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128744
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/128744

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