Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

10.1109/JPHOTOV.2013.2284375

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Main Authors: Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
Format: Article
Published: 2016
Subjects:
Charge carrier lifetime
eddy currents
photoconductivity
silicon
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128744
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1287442023-10-25T20:10:20Z Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. SOLAR ENERGY RESEARCH INST OF S'PORE Charge carrier lifetime eddy currents photoconductivity silicon 10.1109/JPHOTOV.2013.2284375 IEEE Journal of Photovoltaics 4 1 525-531 2016-10-19T08:44:40Z 2016-10-19T08:44:40Z 2014-01 Article Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D. (2014-01). Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime. IEEE Journal of Photovoltaics 4 (1) : 525-531. ScholarBank@NUS Repository. https://doi.org/10.1109/JPHOTOV.2013.2284375 21563381 http://scholarbank.nus.edu.sg/handle/10635/128744 000329038800078 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Charge carrier lifetime
eddy currents
photoconductivity
silicon
spellingShingle Charge carrier lifetime
eddy currents
photoconductivity
silicon
Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
description 10.1109/JPHOTOV.2013.2284375
author2 SOLAR ENERGY RESEARCH INST OF S'PORE
author_facet SOLAR ENERGY RESEARCH INST OF S'PORE
Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
format Article
author Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
author_sort Blum, A.L.
title Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_short Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_full Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_fullStr Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_full_unstemmed Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_sort interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
publishDate 2016
url http://scholarbank.nus.edu.sg/handle/10635/128744
_version_ 1781790604159614976

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