Zhang, G., Yoo, W., Ling, C., & ENGINEERING, E. &. C. (2014). A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET.
استشهاد بنمط شيكاغوZhang, G., W.J Yoo, C.H Ling, و ELECTRICAL & COMPUTER ENGINEERING. A Time-dependent Technique for Carrier Recombination and Generation Lifetime Measurement in SOI MOSFET. 2014.
MLA استشهادZhang, G., W.J Yoo, C.H Ling, و ELECTRICAL & COMPUTER ENGINEERING. A Time-dependent Technique for Carrier Recombination and Generation Lifetime Measurement in SOI MOSFET. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.