An add-on secondary electron energy spectrometer for scanning electron microscopes

10.1063/1.1347376

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Bibliographic Details
Main Authors: Khursheed, A., Karuppiah, N.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54984
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Institution: National University of Singapore