An improved prediction of series resistance in spiral inductor modeling with Eddy-current effect

• Main Authors: Ooi, B.-L., Xu, D.-X., Kooi, P.-S., Lin, F.-J.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Deembedding; Eddy current; Quality factor; Series resistance; Skin effect; Spiral inductor
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55024
• Institution: National University of Singapore

10.1109/TMTT.2002.802337