Context-based recognition of process states using neural networks

• Main Authors: Srinivasan, R., Wang, C., Ho, W.K., Lim, K.W.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Fault diagnosis; Pattern recognition; State identification
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55407
• Institution: National University of Singapore

10.1016/j.ces.2004.09.061