Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images

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Main Authors:	Sim, K.S., Thong, J.T.L., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Binomial distribution Poisson distribution Secondary emission noise Shot noise
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55762
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-55762
record_format	dspace
spelling	sg-nus-scholar.10635-557622015-01-18T01:55:48Z Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images Sim, K.S. Thong, J.T.L. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Binomial distribution Poisson distribution Secondary emission noise Shot noise Scanning 26 1 36-40 SCNND 2014-06-17T02:46:50Z 2014-06-17T02:46:50Z 2004-01 Article Sim, K.S.,Thong, J.T.L.,Phang, J.C.H. (2004-01). Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images. Scanning 26 (1) : 36-40. ScholarBank@NUS Repository. 01610457 http://scholarbank.nus.edu.sg/handle/10635/55762 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Binomial distribution Poisson distribution Secondary emission noise Shot noise
spellingShingle	Binomial distribution Poisson distribution Secondary emission noise Shot noise Sim, K.S. Thong, J.T.L. Phang, J.C.H. Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
description	Scanning
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Sim, K.S. Thong, J.T.L. Phang, J.C.H.
format	Article
author	Sim, K.S. Thong, J.T.L. Phang, J.C.H.
author_sort	Sim, K.S.
title	Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
title_short	Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
title_full	Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
title_fullStr	Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
title_full_unstemmed	Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images
title_sort	effect of shot noise and secondary emission noise in scanning electron microscope images
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55762
_version_	1681084558265548800

Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images

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