Electrical transport properties of ultrathin metallic films
10.1116/1.1935527
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sg-nus-scholar.10635-558202023-10-25T23:12:33Z Electrical transport properties of ultrathin metallic films Tay, M. Li, K. Wu, Y. ELECTRICAL & COMPUTER ENGINEERING 10.1116/1.1935527 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 4 1412-1416 JVTBD 2014-06-17T02:47:30Z 2014-06-17T02:47:30Z 2005 Article Tay, M., Li, K., Wu, Y. (2005). Electrical transport properties of ultrathin metallic films. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 (4) : 1412-1416. ScholarBank@NUS Repository. https://doi.org/10.1116/1.1935527 10711023 http://scholarbank.nus.edu.sg/handle/10635/55820 000231211500012 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Tay, M. Li, K. Wu, Y. |
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Tay, M. Li, K. Wu, Y. Electrical transport properties of ultrathin metallic films |
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Tay, M. |
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Electrical transport properties of ultrathin metallic films |
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Electrical transport properties of ultrathin metallic films |
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Electrical transport properties of ultrathin metallic films |
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Electrical transport properties of ultrathin metallic films |
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Electrical transport properties of ultrathin metallic films |
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electrical transport properties of ultrathin metallic films |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55820 |
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