Exchange bias in patterned FeMn/NiFe bilayers

Exchange bias in patterned FeMn/NiFe bilayers

10.1016/S0304-8853(02)00885-5

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Bibliographic Details
Main Authors: Guo, Z.B, Li, K.B., Han, G.C., Liu, Z.Y., Luo, P., Wu, Y.H.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Exchange bias
Hysteresis loops
Lithography
Training effects
Wire-like array
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55947
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/55947

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