Exchange bias in zinc-blende CrTe-MnTe bilayer

10.1063/1.3157841

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Bibliographic Details
Main Authors: Bi, J.F., Lu, H., Sreenivasan, M.G., Teo, K.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55948
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Institution: National University of Singapore