High-resolution atomic force microscope nanotip grown by self-field emission
10.1063/1.1515120
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sg-nus-scholar.10635-562072023-08-29T08:41:55Z High-resolution atomic force microscope nanotip grown by self-field emission Oon, C.H. Thong, J.T.L. Lei, Y. Chim, W.K. SINGAPORE-MIT ALLIANCE ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1515120 Applied Physics Letters 81 16 3037-3039 APPLA 2014-06-17T02:51:58Z 2014-06-17T02:51:58Z 2002-10-14 Article Oon, C.H., Thong, J.T.L., Lei, Y., Chim, W.K. (2002-10-14). High-resolution atomic force microscope nanotip grown by self-field emission. Applied Physics Letters 81 (16) : 3037-3039. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1515120 00036951 http://scholarbank.nus.edu.sg/handle/10635/56207 000178460500041 Scopus |
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SINGAPORE-MIT ALLIANCE |
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SINGAPORE-MIT ALLIANCE Oon, C.H. Thong, J.T.L. Lei, Y. Chim, W.K. |
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Oon, C.H. Thong, J.T.L. Lei, Y. Chim, W.K. |
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Oon, C.H. Thong, J.T.L. Lei, Y. Chim, W.K. High-resolution atomic force microscope nanotip grown by self-field emission |
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Oon, C.H. |
title |
High-resolution atomic force microscope nanotip grown by self-field emission |
title_short |
High-resolution atomic force microscope nanotip grown by self-field emission |
title_full |
High-resolution atomic force microscope nanotip grown by self-field emission |
title_fullStr |
High-resolution atomic force microscope nanotip grown by self-field emission |
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High-resolution atomic force microscope nanotip grown by self-field emission |
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high-resolution atomic force microscope nanotip grown by self-field emission |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56207 |
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