Label-to-region with continuity-biased bi-layer sparsity Priors

10.1145/2379790.2379792

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Bibliographic Details
Main Authors: Liu, X., Yan, S., Cheng, B., Tang, J., Chua, T.-S., Jin, H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56448
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Institution: National University of Singapore