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Liu, Z., Y. Dan, Q. Jinjun, Y. Wu, و ELECTRICAL & COMPUTER ENGINEERING. Magnetic Force Microscopy Using Focused Ion Beam Sharpened Tip With Deposited Antiferro-ferromagnetic Multiple Layers. 2014.

Liu, Z., et al. Magnetic Force Microscopy Using Focused Ion Beam Sharpened Tip With Deposited Antiferro-ferromagnetic Multiple Layers. 2014.