Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers

Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers

10.1063/1.1456056

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Bibliographic Details
Main Authors: Liu, Z., Dan, Y., Jinjun, Q., Wu, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56552
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/56552

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