Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
10.1063/1.1456056
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sg-nus-scholar.10635-565522023-10-30T09:53:16Z Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers Liu, Z. Dan, Y. Jinjun, Q. Wu, Y. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1456056 Journal of Applied Physics 91 10 I 8843-8845 JAPIA 2014-06-17T02:55:54Z 2014-06-17T02:55:54Z 2002-05-15 Article Liu, Z., Dan, Y., Jinjun, Q., Wu, Y. (2002-05-15). Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers. Journal of Applied Physics 91 (10 I) : 8843-8845. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1456056 00218979 http://scholarbank.nus.edu.sg/handle/10635/56552 000175576400338 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Liu, Z. Dan, Y. Jinjun, Q. Wu, Y. |
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Liu, Z. Dan, Y. Jinjun, Q. Wu, Y. |
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Liu, Z. Dan, Y. Jinjun, Q. Wu, Y. Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
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Liu, Z. |
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Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
title_short |
Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
title_full |
Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
title_fullStr |
Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
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Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
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magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56552 |
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