Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers

10.1063/1.1456056

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Main Authors: Liu, Z., Dan, Y., Jinjun, Q., Wu, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56552
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-565522023-10-30T09:53:16Z Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers Liu, Z. Dan, Y. Jinjun, Q. Wu, Y. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1456056 Journal of Applied Physics 91 10 I 8843-8845 JAPIA 2014-06-17T02:55:54Z 2014-06-17T02:55:54Z 2002-05-15 Article Liu, Z., Dan, Y., Jinjun, Q., Wu, Y. (2002-05-15). Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers. Journal of Applied Physics 91 (10 I) : 8843-8845. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1456056 00218979 http://scholarbank.nus.edu.sg/handle/10635/56552 000175576400338 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1456056
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Liu, Z.
Dan, Y.
Jinjun, Q.
Wu, Y.
format Article
author Liu, Z.
Dan, Y.
Jinjun, Q.
Wu, Y.
spellingShingle Liu, Z.
Dan, Y.
Jinjun, Q.
Wu, Y.
Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
author_sort Liu, Z.
title Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
title_short Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
title_full Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
title_fullStr Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
title_full_unstemmed Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
title_sort magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/56552
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