Liu, Z., Dan, Y., Jinjun, Q., Wu, Y., & ENGINEERING, E. &. C. (2014). Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers.
Chicago Style CitationLiu, Z., Y. Dan, Q. Jinjun, Y. Wu, and ELECTRICAL & COMPUTER ENGINEERING. Magnetic Force Microscopy Using Focused Ion Beam Sharpened Tip With Deposited Antiferro-ferromagnetic Multiple Layers. 2014.
MLA CitationLiu, Z., et al. Magnetic Force Microscopy Using Focused Ion Beam Sharpened Tip With Deposited Antiferro-ferromagnetic Multiple Layers. 2014.
Warning: These citations may not always be 100% accurate.