APA استشهاد

Yeo, Y., & ENGINEERING, E. &. C. (2014). Metal gate technology for nanoscale transistors - Material selection and process integration issues.

استشهاد بنمط شيكاغو

Yeo, Y.-C., و ELECTRICAL & COMPUTER ENGINEERING. Metal Gate Technology for Nanoscale Transistors - Material Selection and Process Integration Issues. 2014.

MLA استشهاد

Yeo, Y.-C., و ELECTRICAL & COMPUTER ENGINEERING. Metal Gate Technology for Nanoscale Transistors - Material Selection and Process Integration Issues. 2014.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.