Metal gate technology for nanoscale transistors - Material selection and process integration issues

10.1016/j.tsf.2004.05.039

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Bibliographic Details
Main Author: Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56607
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Institution: National University of Singapore