Micromechanical resonators with sub-micron capacitive gaps in 2 μm process

10.1049/el:20072841

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Bibliographic Details
Main Authors: Shao, L.C., Palaniapan, M., Khine, L., Tan, W.W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56623
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-566232024-11-09T07:24:30Z Micromechanical resonators with sub-micron capacitive gaps in 2 μm process Shao, L.C. Palaniapan, M. Khine, L. Tan, W.W. ELECTRICAL & COMPUTER ENGINEERING 10.1049/el:20072841 Electronics Letters 43 25 1427-1428 ELLEA 2014-06-17T02:56:42Z 2014-06-17T02:56:42Z 2007 Article Shao, L.C., Palaniapan, M., Khine, L., Tan, W.W. (2007). Micromechanical resonators with sub-micron capacitive gaps in 2 μm process. Electronics Letters 43 (25) : 1427-1428. ScholarBank@NUS Repository. https://doi.org/10.1049/el:20072841 00135194 http://scholarbank.nus.edu.sg/handle/10635/56623 000252315600019 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1049/el:20072841
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Shao, L.C.
Palaniapan, M.
Khine, L.
Tan, W.W.
format Article
author Shao, L.C.
Palaniapan, M.
Khine, L.
Tan, W.W.
spellingShingle Shao, L.C.
Palaniapan, M.
Khine, L.
Tan, W.W.
Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
author_sort Shao, L.C.
title Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
title_short Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
title_full Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
title_fullStr Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
title_full_unstemmed Micromechanical resonators with sub-micron capacitive gaps in 2 μm process
title_sort micromechanical resonators with sub-micron capacitive gaps in 2 μm process
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/56623
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