Origins of ferromagnetism in transition-metal doped Si

Origins of ferromagnetism in transition-metal doped Si

10.1063/1.2963485

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Bibliographic Details
Main Authors: Ko, V., Teo, K.L., Liew, T., Chong, T.C., MacKenzie, M., MacLaren, I., Chapman, J.N.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56969
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/56969

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