Origins of magnetic damping measurement variations using ferromagnetic resonance for nano-sized devices

10.1063/1.4811146

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Bibliographic Details
Main Authors:	Eason, K., Sabino, M.P.R.G., Tran, M., Fook Liew, Y.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56970
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Institution:	National University of Singapore

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