Outage probability of Rician fading relay channels

10.1109/TVT.2007.912603

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Bibliographic Details
Main Authors: Zhu, Y., Xin, Y., Kam, P.-Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56975
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Institution: National University of Singapore