Residual admission capacity in optical burst switching networks and its application in configuration of loss guaranteed tunnels

10.1109/JLT.2008.928540

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Bibliographic Details
Main Authors: Chen, Q., Mohan, G., Chua, K.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57254
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Institution: National University of Singapore