Robust line detection using two-orthogonal direction image scanning

10.1016/j.cviu.2011.03.010

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Bibliographic Details
Main Authors: Yang, K., Sam Ge, S., He, H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57301
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Institution: National University of Singapore